Research interests
Dr. Han is a materials scientist with more than six years of experience in electron microscopy and advanced materials characterization, including SEM, TEM, FIB and AFM. Before joining the ACEM Core, he was a Research Specialist at the Keith Porter Imaging Facility at the University of Maryland, Baltimore County (2025), where he developed microscopy-based metrology workflows and supported researchers and industry users.
He earned his Ph.D. in Materials Science and Engineering at the University of Delaware, where he also supported the Keck Center for Advanced Microscopy and Microanalysis. His research used in-situ TEM to study phase evolution and microstructural change in advanced alloys and magnetic materials, and the effects of biasing and the electron beam on electrochemistry. At the ACEM Core he helps users with site-specific FIB lift-out, TEM imaging and analysis, and instrument training.
Education
- Ph.D., Materials Science and Engineering, University of Delaware (2024)
- M.S., Materials Science and Engineering, University of Illinois Urbana-Champaign (2018)
- B.S., Materials Chemistry and B.S., Applied Mathematics, University of California, Los Angeles (2016)
Selected awards
- Chairperson's Outstanding Graduate Student Award, Materials Science and Engineering, University of Delaware (2022)
- Innovation Seed Grant, Singh Center for Nanotechnology, University of Pennsylvania (2023)
- MSE Visiting Scientist, Whiting School of Engineering, Johns Hopkins University (2025)